To calculate memory testing time, user can use following formula
Testing time = Addresses of memory * testing algorithm complexity / Frequency
For example, if we have
Memory addresses = 4096
Using March 17N algorithm, Complexity = 17
Testing frequency = 300 Mhz
Testing time = 4096 * 17 / 300Mhz = 232.1 μs
If designer implement soft repair in their own design, if found defect in the memory, then system execute soft repair and run memory BIST testing again to make sure memory without any defect.
Using the same example, the testing time is
Testing time = 232.1 * 2 = 464.2 μs